Built-In Self-Test (BIST) in the era of deep sub-micron technology

Northcon - Conference Record

Volumn , Issue , 1996, Pages 312-315

  Koenemann, Bernd ^a   Pateras, Stephen ^a  

^a LogicVision Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED NETWORK ANALYSIS; COST EFFECTIVENESS; INTEGRATED CIRCUIT TESTING; PROGRAM DEBUGGING;

BUILT IN SELF TEST (BIST); DESIGN FOR TEST (DFT);

MICROELECTRONIC PROCESSING;

EID: 0030384599     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)