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Volumn 327, Issue , 1996, Pages 47-53

Photothermal pyrometry for temperature measurement

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; LASERS; SILICON; TEMPERATURE; WIRE;

EID: 0030384575     PISSN: 02725673     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (2)

References (20)
  • 5
    • 0002602637 scopus 로고
    • Theory and Technique for Surface Temperature Determinations by Measuring the Radiance Temperatures and the Absorptance Ratio for Two Wavelengths
    • Plumb, H.H., ed.
    • Dewitt D.P. and Kunz, H., 1972, "Theory and Technique for Surface Temperature Determinations by Measuring the Radiance Temperatures and the Absorptance Ratio for Two Wavelengths," in Temperature: Its Measurement and Control in Science and Industry, Plumb, H.H., ed., Vol. 4, pp. 599-610.
    • (1972) Temperature: Its Measurement and Control in Science and Industry , vol.4 , pp. 599-610
    • Dewitt, D.P.1    Kunz, H.2
  • 9
    • 0029411339 scopus 로고
    • Numerical and Experimental Analysis of Combined Convective and Radiative Heat Transfer in Laminar Flow over a Circular Cylinder
    • Kaminski, D.A., Fu, X.D. and Jensen, M.K., 1995, "Numerical and Experimental Analysis of Combined Convective and Radiative Heat Transfer in Laminar Flow over a Circular Cylinder," International Journal of Heat and Mass Transfer, Vol. 38, pp. 3161-3169.
    • (1995) International Journal of Heat and Mass Transfer , vol.38 , pp. 3161-3169
    • Kaminski, D.A.1    Fu, X.D.2    Jensen, M.K.3
  • 10
    • 1542796258 scopus 로고
    • Noncontact Surface Temperature Measurement by Means of a Modulated Photothermal Effects
    • Loarer, T., Greffet, J.-J., and Heutz-Aubert M., 1990, "Noncontact Surface Temperature Measurement by Means of a Modulated Photothermal Effects," Applied Optics, Vol. 29, pp. 979-987.
    • (1990) Applied Optics , vol.29 , pp. 979-987
    • Loarer, T.1    Greffet, J.-J.2    Heutz-Aubert, M.3
  • 11
    • 84975664134 scopus 로고
    • Application of the Pulsed Photothermal Effect to Fast Surface Temperature Measurements
    • Loarer, T. and Greffet, J-J., 1992, "Application of the Pulsed Photothermal Effect to Fast Surface Temperature Measurements," Applied Optics, Vol. 31, pp. 5350-5358.
    • (1992) Applied Optics , vol.31 , pp. 5350-5358
    • Loarer, T.1    Greffet, J.-J.2
  • 13
    • 0028368778 scopus 로고
    • Spectroscopic Method for Measuring Surface Temperature That Is Independent of Material Emissivity, Surrounding Radiation Sources, and Instrument Calibration
    • Markham, J.R., Best, P.E., and Solomon, P.R., 1994, "Spectroscopic Method for Measuring Surface Temperature That Is Independent of Material Emissivity, Surrounding Radiation Sources, and Instrument Calibration," Applied Spectroscopy, Vol. 48, pp. 265-270.
    • (1994) Applied Spectroscopy , vol.48 , pp. 265-270
    • Markham, J.R.1    Best, P.E.2    Solomon, P.R.3
  • 14
    • 0020140005 scopus 로고
    • Thermal-Wave Depth Profiling: Theory
    • Opsal, J. and Rosencwaig, A., 1982, "Thermal-Wave Depth Profiling: Theory," Journal of Applied Physics, Vol. 53, pp. 4240-4246.
    • (1982) Journal of Applied Physics , vol.53 , pp. 4240-4246
    • Opsal, J.1    Rosencwaig, A.2
  • 16
    • 0003103474 scopus 로고
    • Manufacturing Equipment Issues in Rapid Thermal Processing
    • Fair, R.B., ed., Academic Press, Boston
    • Rooseboom, F., 1993, "Manufacturing Equipment Issues in Rapid Thermal Processing," in Rapid Thermal Processing: Science and Technology, Fair, R.B., ed., pp. 351-424, Academic Press, Boston.
    • (1993) Rapid Thermal Processing: Science and Technology , pp. 351-424
    • Rooseboom, F.1
  • 18
    • 0021372644 scopus 로고
    • Pulsed Photothermal Radiometry for Noncontact Spectroscopy, Material Testing and Inspection Measurements
    • Tam, A.C., 1985, "Pulsed Photothermal Radiometry for Noncontact Spectroscopy, Material Testing and Inspection Measurements," Infrared Physics, Vol. 25, pp. 305-313.
    • (1985) Infrared Physics , vol.25 , pp. 305-313
    • Tam, A.C.1
  • 19
    • 0001319837 scopus 로고
    • Emissivity of Silicon at Elevated Temperatures
    • Timans, P.J., 1993, "Emissivity of Silicon at Elevated Temperatures," Journal of Applied Physics, Vol. 74, pp. 6353-6364.
    • (1993) Journal of Applied Physics , vol.74 , pp. 6353-6364
    • Timans, P.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.