CDM ESD test considered phenomena of division and reduction of high voltage discharge in the environment

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 1996, Pages 54-61

  Tanaka, Masaki ^a   Okada, Koji ^a  

^a HITACHI LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; ELECTROSTATICS;

CHARGED DEVICE MODEL (CDM); CORONA DISCHARGE; DISCHARGE RESISTANCE;

ELECTRIC CORONA;

EID: 0030384444     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)