Human sensitivity of color defects inspection

IECON Proceedings (Industrial Electronics Conference)

Volumn 2, Issue , 1996, Pages 713-718

  Hata, Seiji ^a   Miyashita, Yoshihiro ^a   Hanafusa, Hideyuki ^a  

^a KAGAWA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COLOR IMAGE PROCESSING; QUALITY CONTROL; SENSITIVITY ANALYSIS;

COLOR DEFECTS INSPECTION; COLOR SIGNAL VALUES; HUMAN SENSITIVITY; VISUAL INSPECTION SYSTEM;

COMPUTER VISION;

EID: 0030384140     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (3)