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Volumn 27, Issue 6, 1996, Pages 1057-1060

Characterization of titanium thin films prepared by bias assisted magnetron sputtering

Author keywords

[No Author keywords available]

Indexed keywords

FILM PREPARATION; GRAIN SIZE AND SHAPE; MAGNETRON SPUTTERING; METALLIZING; METALLOGRAPHIC MICROSTRUCTURE; PHASE TRANSITIONS; PRESSURE EFFECTS; SPUTTER DEPOSITION; STRESS ANALYSIS; THIN FILMS; TITANIUM;

EID: 0030383822     PISSN: 10735615     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11663-996-0020-0     Document Type: Article
Times cited : (6)

References (16)
  • 4
    • 0003427458 scopus 로고
    • Addison-Wesley Publishing Company, London
    • B.D. Cullity: Elements of X-Ray Diffraction, Addison-Wesley Publishing Company, London, 1967, pp. 444-53.
    • (1967) Elements of X-Ray Diffraction , pp. 444-453
    • Cullity, B.D.1
  • 6
    • 0014598944 scopus 로고
    • P.R. Stuart: Vacuum, 1969, vol. 19, pp. 507-11.
    • (1969) Vacuum , vol.19 , pp. 507-511
    • Stuart, P.R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.