High-power and highly-reliable operation of 0.98-μm lasers with an exponential-shaped flared stripe

Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS

Volumn 1, Issue , 1996, Pages 42-43

  Sagawa, M ^a   Hiramoto, K ^a   Toyonaka, T ^a   Kikawa, T ^a   Uomi, K ^a  

^a HITACHI LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DENSITY (OPTICAL); ELECTRIC CURRENTS; QUANTUM EFFICIENCY; RELIABILITY; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING INDIUM COMPOUNDS;

CATASTROPHIC OPTICAL DAMAGE; EXPONENTIAL SHAPED FLARED STRIPE; STRAIGHT STRIPE LASERS; STRAINED QUANTUM WELL LASERS;

QUANTUM WELL LASERS;

EID: 0030382991     PISSN: 10928081     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)