Modal noise in 2.5 Gbit/s data links with oxidized VCSELs

Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS

Volumn 2, Issue , 1996, Pages 71-72

  Fiedler, U ^a   Weigl, B ^a   Reiner, G ^a   King, R ^a   Ebeling, K J ^a  

^a UNIVERSITY OF ULM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BIT ERROR RATE; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR LASERS; SEMICONDUCTOR QUANTUM WELLS; SIGNAL NOISE MEASUREMENT; SPURIOUS SIGNAL NOISE; TRANSMITTERS;

MODE SELECTIVE LOSSES (MSL); OPTICAL ATTENUATORS; VERTICAL CAVITY SURFACE EMITTING LASERS (VCSEL);

OPTICAL COMMUNICATION EQUIPMENT;

EID: 0030382641     PISSN: 10928081     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)