BiMOS modeling for reliable SOI circuit design

IEEE International SOI Conference

Volumn , Issue , 1996, Pages 140-141

  Krishnan, S ^a   Fossum, J G ^a   Pelella, M M ^a  

^a UNIVERSITY OF FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC BREAKDOWN; ELECTRIC NETWORK ANALYSIS; LEAKAGE CURRENTS; MOSFET DEVICES; SEMICONDUCTOR DEVICE MODELS; SILICON ON INSULATOR TECHNOLOGY;

BIPOLAR JUNCTION TRANSISTORS (BJT); CHARGE COUPLING; DRAIN SOURCE BREAKDOWN; FLOATING BODY EFFECT;

BIPOLAR TRANSISTORS;

EID: 0030381534     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)