New features of C-type defects on the Si(100) surface observed by scanning tunnelling microscopy

Surface Science

Volumn 369, Issue 1-3, 1996, Pages

  Zhang, Z ^a   Kulakov, M A ^a   Bullemer, B ^a  

^a BUNDESWEHR UNIVERSITY MUNICH   (Germany)

Author keywords

Low index single crystal surfaces; Scanning tunnelling microscopy; Silicon; Surface defects; Surface structure, morphology, roughness, and topography

Indexed keywords

CRYSTAL DEFECTS; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SINGLE CRYSTALS; SURFACE ROUGHNESS;

BIASED TIP SCANNING; TOPOGRAPHY;

SEMICONDUCTING SILICON;

EID: 0030381467     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(96)01129-6     Document Type: Article

References (21)

1. R.E. Schlier and H.E. Farnsworth, J. Chem. Phys. 30 (1959) 917.
2. T.D. Poppendieck, T.C. Ngoc and M.B. Webb, Surf. Sci. 75 (1978) 287.
3. M.J. Cardillo and G.E. Becker, Phys. Rev. B 21 (1980) 1497.
4. W.S. Yang, F. Jona and P.M. Marcus, Phys. Rev. B 28 (1983) 2049.
5. M.J. Cardillo and W.R. Lambert, Surf. Sci. 168 (1986) 724.
6. D.J. Chadi, Phys. Rev. Lett. 43 (1979) 43.
7. J. Ihm, M.L. Cohen and D.J. Chadi, Phys. Rev. B 21 (1980) 4592.
8. R.M. Tromp, R.J. Hamers and J.E. Demuth, Phys. Rev. Lett. 55 (1985) 1303.
9. R.J. Hamers, R.M. Tromp and J.E. Demuth, Phys. Rev. B 34 (1986) 5343.
10. R.J. Hamers, R.M. Tromp and J.E. Demuth, Surf. Sci. 181 (1987) 346.
11. R.A. Wolkov, Phys. Rev. Lett. 68 (1992) 2636.
12. R.J. Hamers and U.K. Köhler, J. Vac. Sci. Technol. A 7 (1989) 2854.
13. K.C. Pandey, in: Proceedings of the 17th International Conference on the Physics of Semiconductors (Springer, Berlin, 1985).
14. P. Heuell, S. Cuzdi, M.A. Kulakov and B. Bullemer, Thin Solid Films 246 (1995) 217.
15. B.S. Swartzentruber, Y.W. Mo and M.G. Lagally, J. Vac. Sci. Technol. A 7 (1989) 2901.
16. M. Chander, Y.Z. Li, C. Patrin and J.H. Weaver, Phys. Rev. B 48 (1993) 2493.
17. J.H.G. Owen, D.R. Bowler, C.M. Goringe, K. Miki and G.A.D. Briggs, Surf. Sci. 341 (1995) L1042.
18. J.J. Boland, Adv. Phys. 42 (1993) 129.
19. J.V. Seiple and J.P. Pelz, Phys. Rev. Lett. 73 (1994) 999.
20. J. Pollmann, P. Kruger and A. Mazur, J. Vac. Sci. Technol. B 5 (1986) 945.
21. R. Becker and R. Wolkov, Methods Exp. Phys. 27 (1993) 149.