High-frequency field effects on ionic defect concentrations and solid-state diffusion processes

Materials Research Society Symposium - Proceedings

Volumn 430, Issue , 1996, Pages 417-422

  Freeman, S A ^a   Booske, J H ^a   Cooper, R F ^a  

^a UNIVERSITY OF WISCONSIN MADISON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DIFFUSION IN SOLIDS; INTERFACES (MATERIALS); IONIC CONDUCTION IN SOLIDS; MICROWAVES;

IONIC FLUXES; IONIC TRANSPORT; MICROWAVE INDUCED DRIVING FORCE;

ELECTROMAGNETIC FIELD EFFECTS;

EID: 0030381428     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-430-417     Document Type: Conference Paper

References (9)