AND/EXOR-based synthesis of testable KFDD-circuits with small depth

Proceedings of the Asian Test Symposium

Volumn , Issue , 1996, Pages 148-154

  Hengster, Harry ^a   Drechsler, Rolf ^a   Eckrich, Stefan ^a   Pfeiffer, Tonja ^a   Becker, Bernd ^a  

^a UNIVERSITY OF FREIBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EXOR GATES; KRONECKER FUNCTIONAL DECISION DIAGRAMS (KFDD);

BINARY SEQUENCES; BOOLEAN FUNCTIONS; DECISION TABLES; ELECTRIC NETWORK SYNTHESIS; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT TESTING; LOGIC DESIGN; LOGIC GATES;

LOGIC CIRCUITS;

EID: 0030381186     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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