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Volumn 426, Issue , 1996, Pages 243-254
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Defect chalcopyrite Cu(In1-xGax)3Se5 polycrystalline thin-film materials
a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
COMPOSITION EFFECTS;
COPPER COMPOUNDS;
ELECTRIC CONDUCTIVITY OF SOLIDS;
EVAPORATION;
GLASS;
MORPHOLOGY;
PHOTOVOLTAIC CELLS;
POLYCRYSTALLINE MATERIALS;
SEMICONDUCTING GALLIUM COMPOUNDS;
SEMICONDUCTOR JUNCTIONS;
THIN FILMS;
X RAY DIFFRACTION ANALYSIS;
CHALCOPYRITES;
COPPER INDIUM GALLIUM SELENIDE;
MICROGRAPHS;
OPTICAL BANDGAPS;
SEMICONDUCTING FILMS;
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EID: 0030381086
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1557/proc-426-243 Document Type: Conference Paper |
Times cited : (23)
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References (11)
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