Using IDD to analyze analog faults and development of a sensor

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2874, Issue , 1996, Pages 152-161

  Maidon, Yvan ^a   Deval, Yann ^a   Fremont, Helene ^a   Dom, Jean P ^a  

^a UNIVERSITÉ DE BORDEAUX   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT UNDER TEST; FAULT DETECTION;

ANALOG COMPUTERS; DESIGN; INTEGRATED CIRCUITS; PERFORMANCE; SENSORS; SIGNAL PROCESSING; TRANSDUCERS;

SEMICONDUCTOR DEVICE TESTING;

EID: 0030380703     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)