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Volumn 436, Issue , 1996, Pages
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Mechanics of a free-standing strained film/compliant substrate system
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Author keywords
[No Author keywords available]
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Indexed keywords
BIFURCATION (MATHEMATICS);
DISLOCATIONS (CRYSTALS);
EPITAXIAL GROWTH;
INTERFACES (MATERIALS);
MECHANICS;
PLASTIC DEFORMATION;
STRAIN;
STRESS CONCENTRATION;
THICKNESS MEASUREMENT;
COMPLIANT SUBSTRATE SYSTEM;
FREE STANDING STRAINED FILM;
MATTHEWS-BLAKESLEE CRITERION;
MISMATCH STRAIN;
STONEY FORMULA;
THIN FILMS;
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EID: 0030379824
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1557/proc-436-393 Document Type: Conference Review |
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Times cited : (4)
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References (14)
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