Influence of the laser wavelength on the microstructure of laser ablated Ba0.5Sr0.5TiO3 films

Journal of Applied Physics

Volumn 80, Issue 12, 1996, Pages 7046-7051

  Tcheliebou, Frédéric ^a   Baik, Sunggi ^a,b  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

^b UNIVERSITÉ MONTPELLIER II   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM COMPOUNDS; LASER ABLATION; LASER BEAMS; MICROSTRUCTURE; MORPHOLOGY; NEODYMIUM LASERS; POLYCRYSTALLINE MATERIALS; Q SWITCHED LASERS; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; THICK FILMS; X RAY DIFFRACTION;

IN SITU PULSED LASER DEPOSITION METHOD; LASER WAVELENGTH; PULSE ENERGY DENSITY; PULSED LASER ABLATION; QUARTZ LENS; SURFACE PROFILOMETRY; ULTRAVIOLET VISIBLE SPECTROPHOTOMETER;

THIN FILMS;

EID: 0030379802     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363778     Document Type: Article

References (27)

1. D. Roy, C. J. Peng, and S. B. Krupanidhi, Appl. Phys. Lett. 60, 2478 (1992).
2. V. K. Varadan, K. A. Jose, V. V. Varadan, R. Hughes, and J. F. Kelly, Microw. J. 38, 244 (1995).
3. T. S. Kim, M. H. Oh, and C. H. Kim, Thin Solid Films 254, 273 (1995).
4. A. Nazeri and M. Kahn, J. Mater. Sci. Lett. 14, 1085 (1995).
5. T. Nakamura, Y. Yamanaka, A. Morimoto, and T. Shimizu, Jpn. J. Appl. Phys. 34, 5150 (1995).
6. M. G. Norton, C. Scarone, J. Li, C. B. Carter, and J. F. Mayer, J. Mater. Res. 6, 2022 (1991).
7. G. A. Petersen, Jr. and J. R. McNeil, Thin Solid Films 220, 87 (1992).
8. I. W. Boyd, Laser Processing of Thin Films and Microstructure, (Springer, Heidelberg, 1987), p. 101.
9. C. J. Peng and S. B. Kupanidhi, Thin Solid Films 219, 162 (1992).
10. Li-Chyng Chen, in Pulsed Laser Deposition of Thin Films, edited by D. B. Chrisey and G. K. Hubler, (Wiley, New York, 1994), p. 168.
11. H. Sankur and J. T. Cheung, Appl. Phys. A 47, 271 (1988).
12. G. Koren, R. J. Baseman, A. Gupta, M. I. Lutwyche, and R. B. Laibowitz, Appl. Phys. Lett. 56, 2144 (1990).
13. D. S. Misra and S. B. Palmer, Physica C 176, 43 (1991).
14. J. S. Reed, Principle of Ceramic Processing, 2nd ed. (Wiley, New York, 1994), p. 121.
15. S. H. Lee, S. C. Bae, J. K. Ku, and H. J. Shin, Phys. Rev. B 36, 9142 (1992).
16. D. Kolar, M. Trontelj, and Z. Stadler, J. Am. Ceram. Soc. 65, 470 (1982).
17. N. A. Basit and H. K. Kim, J. Vac. Sci. Technol. A 13, 2214 (1995).
18. P. D. Harmsworth and R. Stevens, J. Mater. Sci. 27, 616 (1992).
19. R. F. Haglund, Jr. and N. Itoh, in Laser Ablation, Principles and Applications, edited by J. C. Miller (Springer, Heidelberg, 1994), p. 11.
20. R. E. Leuchtner and K. S. Grabowski, in Pulsed Laser Deposition of Thin Films, edited by D. B. Chrisey and G. K. Hubler (Wiley, New York, 1994), p. 473.
21. G. Callies, P. Berger, and H. Hügel, J. Phys. D: Appl. Phys. 28, 794 (1995).
22. N. Bloembergen, AIP Conf. Proc. 50, 6 (1979).
23. R. Swanepoel, J. Phys. E: Sci. Instrum. 16, 1214 (1983).
24. T. He, P. Ehrhart, and P. Meuffels, J. Appl. Phys. 79, 3219 (1996).
25. V. I. Mazhukin, I. Smurov, and G. Flamant, J. Appl. Phys. 78, 1259 (1995).
26. R. K. Singh and J. Narayan, Phys. Rev. 41, 8843 (1990).
27. S. C. Tauc, Optical Properties of Solids (North-Holland, Amsterdam, 1972), p. 372.