Progress towards a high-resolution x-ray photon counter

Materials Research Society Symposium - Proceedings

Volumn 420, Issue , 1996, Pages 177-181

  Apte, R B ^a   Nickel, N ^a   Street, R A ^a   Weisfield, R ^a   Wu, J X D ^a   Ready, S ^a   Nguyen, M ^a   Nylen, P ^a  

^a PALO ALTO RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; AMPLIFIERS (ELECTRONIC); CAPACITANCE; IMAGE PROCESSING; PHOTONS; SHOT NOISE; SIGNAL DETECTION; SIGNAL NOISE MEASUREMENT; SPURIOUS SIGNAL NOISE; X RAYS;

AMORPHOUS SILICON IMAGING SYSTEM; CHARGE SENSITIVE AMPLIFIER; HIGH RESOLUTION X RAY PHOTON COUNTER;

SEMICONDUCTOR COUNTERS;

EID: 0030379697     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-420-177     Document Type: Conference Paper

References (8)