Calorimetric investigation of relaxation processes in disordered semiconductors

Materials Research Society Symposium - Proceedings

Volumn 420, Issue , 1996, Pages 635-640

  Budaguan, B G ^a   Alvazov, A A ^a   Sazonov, A Yu ^a  

^a NATIONAL RESEARCH UNIVERSITY OF ELECTRONIC TECHNOLOGY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; CRYSTAL MICROSTRUCTURE; DIFFERENTIAL SCANNING CALORIMETRY; ETCHING; POROUS SILICON; RELAXATION PROCESSES; THERMAL EFFECTS;

ELECTROCHEMICAL ETCHING; HYDROGENATED AMORPHOUS SILICON;

AMORPHOUS SILICON;

EID: 0030379684     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-420-635     Document Type: Conference Paper

References (12)