Indentation modulus and hardness in heteroepitaxial AlxGa1-xP films

Materials Research Society Symposium - Proceedings

Volumn 436, Issue , 1996, Pages

  Roos, B ^a   Santana, C J ^a   Abernathy, C R ^a   Jones, K S ^a  

^a IHP   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; DISLOCATIONS (CRYSTALS); ELASTIC MODULI; EPITAXIAL GROWTH; HARDENING; HARDNESS; MECHANICAL VARIABLES MEASUREMENT; MOLECULAR BEAM EPITAXY; SEMICONDUCTING ALUMINUM COMPOUNDS; STACKING FAULTS; TRANSMISSION ELECTRON MICROSCOPY;

ALUMINUM GALLIUM PHOSPHIDE; INDENTATION MODULUS; MICROTWINS; SINGLE CRYSTAL FILMS; STRUCTURAL PROPERTIES;

SEMICONDUCTING FILMS;

EID: 0030379354     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-436-499     Document Type: Conference Review

References (17)