TEM study of diamond films grown from fullerene precursors

Materials Research Society Symposium - Proceedings

Volumn 403, Issue , 1996, Pages 291-296

  Csencsits, R ^a   Gruen, D M ^a   Krauss, A R ^a   Zuiker, C ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; DIAMOND FILMS; ELECTRON DIFFRACTION; ELECTRON ENERGY LOSS SPECTROSCOPY; FILM GROWTH; GRAIN SIZE AND SHAPE; INTERFEROMETRY; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; NUCLEATION; SURFACE ROUGHNESS; TRIBOLOGY;

FULLERENE PRECURSORS; LASER REFLECTANCE INTERFEROMETRY; MICRODIFFRACTION; ROOT MEAN SQUARE;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 0030378566     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)