Influence of solute additions on electromigration in aluminum

Materials Research Society Symposium - Proceedings

Volumn 428, Issue , 1996, Pages 213-218

  Kim, Choong Un ^a   Morris Jr , J W ^a   Genin, F Y ^a   Fluss, M J ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; BINARY ALLOYS; COMPOSITION EFFECTS; COPPER; METALLIC FILMS; SEMICONDUCTING ALUMINUM COMPOUNDS; SOLUBILITY; THIN FILMS;

CROSS STRIP TECHNIQUE; MOBILE ATOMS; NEGATIVE EFFECTIVE VALENCE;

ELECTROMIGRATION;

EID: 0030378523     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-428-213     Document Type: Conference Paper

References (20)