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Volumn 96, Issue 1, 1996, Pages 3-7

Using metrics to monitor concurrent product development

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED MANUFACTURING; CONCURRENT ENGINEERING; INFORMATION USE; MEASUREMENTS; PROCESS ENGINEERING;

EID: 0030378286     PISSN: 02635577     EISSN: None     Source Type: Journal    
DOI: 10.1108/02635579610107701     Document Type: Article
Times cited : (3)

References (8)
  • 1
    • 0026944407 scopus 로고
    • A pattern recognition approach for software engineering data analysis
    • November
    • Briand, L., Basili, V. and Thomas, W., "A pattern recognition approach for software engineering data analysis", IEEE Transactions on Software Engineering, Vol. 18 No. 11, November 1992, pp. 931-42.
    • (1992) IEEE Transactions on Software Engineering , vol.18 , Issue.11 , pp. 931-942
    • Briand, L.1    Basili, V.2    Thomas, W.3
  • 3
    • 0022576316 scopus 로고
    • Exponential order statistic models of software reliability growth
    • January
    • Miller, D.R., "Exponential order statistic models of software reliability growth", IEEE Transactions on Software Engineering, Vol. SE-12 No. 1, January 1986, pp. 12-24.
    • (1986) IEEE Transactions on Software Engineering , vol.SE-12 , Issue.1 , pp. 12-24
    • Miller, D.R.1
  • 5
    • 0021468304 scopus 로고
    • Software reliability analysis models
    • July
    • Ohba, M., "Software reliability analysis models", IBM Journal of Research and Development, Vol. 28 No.4, July 1984, pp. 428-43.
    • (1984) IBM Journal of Research and Development , vol.28 , Issue.4 , pp. 428-443
    • Ohba, M.1
  • 6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.