Time dependent deformation during indentation testing

Materials Research Society Symposium - Proceedings

Volumn 436, Issue , 1996, Pages

  Lucas, B N ^a   Oliver, W C ^a   Pharr, G M ^a   Loubet, J L ^a  

^a Nano Instruments Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CREEP TESTING; ELECTROLYTIC POLISHING; HARDNESS; MECHANICAL TESTING; MECHANICAL VARIABLES MEASUREMENT; PLASTIC DEFORMATION; STRAIN RATE;

CONSTANT LOADING RATE; CONSTANT STRESS TENSILE TESTS; INDENTATION TESTING; TIME DEPENDENT DEFORMATION;

INDIUM;

EID: 0030378278     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-436-233     Document Type: Conference Review

References (4)