Group-theoretical consideration of raman modes in Nd-doped PZT thin films for structure characterization

Ferroelectrics

Volumn 184, Issue 1-4, 1996, Pages 69-78

  Frantti, J ^a   Lantto, V ^a   Lapp Alainen, J ^a  

^a UNIVERSITY OF OULU   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; DEPOSITION; DOPING (ADDITIVES); EXCIMER LASERS; LASER ABLATION; NEODYMIUM; PHONONS; RAMAN SPECTROSCOPY; SAPPHIRE; STRUCTURE (COMPOSITION); THIN FILMS; X RAY SPECTROSCOPY;

ENERGY DISPERSION X RAY SPECTROSCOPY; LEAD ZIRCONATE TITANATE; MORPHOTROPIC PHASE BOUNDARY; PHONON SYMMETRY; PULSED LASER ABLATION; XENON CHLORIDE EXCIMER LASER;

LEAD COMPOUNDS;

EID: 0030377469     PISSN: 00150193     EISSN: None     Source Type: Journal    
DOI: 10.1080/00150199608230246     Document Type: Article

References (11)

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