Non-destructive in situ analysis of interface processes and thin film growth

Journal of Adhesion

Volumn 58, Issue 3-4, 1996, Pages 227-241

  Buck, M ^a   Dressler, Ch ^a   Grunze, M ^a   Trager F ^b  

^a UNIVERSITY OF HEIDELBERG   (Germany)

^b UNIVERSITY OF KASSEL   (Germany)

Author keywords

Film growth; In situ monitoring; Polyamic acid; Polymer films; Polymer metal interfaces; Second harmonic generation

Indexed keywords

AMINES; FILM GROWTH; INTERFACES (MATERIALS); MOLECULAR ORIENTATION; MONITORING; OPTICAL PROPERTIES; ORGANIC POLYMERS; SECOND HARMONIC GENERATION; THIN FILMS;

DIAMINOBIPHENYL BENZIDINE; DIAMINODIPHENYL DISULFIDE; IN SITU MONITORING; OXYDIANILINE; POLYAMIC ACID; PYROMELLITIC DIANHYDRIDE;

NONDESTRUCTIVE EXAMINATION;

EID: 0030377155     PISSN: 00218464     EISSN: None     Source Type: Journal    
DOI: 10.1080/00218469608015202     Document Type: Article

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