Atomic spectroscopy with surface wave plasmas

Fresenius' Journal of Analytical Chemistry

Volumn 355, Issue 5-6, 1996, Pages 494-500

  Hubert, J ^a   Bordeleau, S ^a   Tran, K C ^a   Michaud, S ^a   Muette, B ^a   Sing, R ^a   Jalbert, J ^a   Boudreau, D ^a   Moisan, M ^a   Margot, J ^a  

^a UNIVERSITÉ DE MONTRÉAL   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ANALYSIS; EMISSION SPECTROSCOPY; SIGNAL TO NOISE RATIO; SURFACE WAVES;

DETECTION LIMIT; GAS MIXTURE; MICROWAVE INDUCED PLASMA SPECTROMETRY; PERFORMANCE EVALUATION; PLASMA GAS; SURFATRON;

ATOMIC SPECTROSCOPY;

EID: 0030375022     PISSN: 09370633     EISSN: None     Source Type: Journal    
DOI: 10.1007/s0021663550494     Document Type: Article

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