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Volumn 47, Issue 4, 1996, Pages 378-379
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Isotropical dry etching of silicon with high rate and planarized surface by using SF6 plasma
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Author keywords
[No Author keywords available]
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Indexed keywords
DRY ETCHING;
PLASMA ETCHING;
SEMICONDUCTOR MATERIALS;
SILICON;
SILICON WAFERS;
SURFACE ROUGHNESS;
SURFACES;
EXPERIMENTAL STUDY;
INDUCTIVELY COUPLED PLASMA;
KINETICS;
OPERATING MODE;
SURFACE TREATMENT;
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EID: 0030375008
PISSN: 09151869
EISSN: None
Source Type: Journal
DOI: 10.4139/sfj.47.378 Document Type: Article |
Times cited : (1)
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References (3)
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