Displacement and strain imaging for an elasticity microscope

Proceedings of the IEEE Ultrasonics Symposium

Volumn 2, Issue , 1996, Pages 1143-1146

  Cohn, N A ^a   Emelianov, S Y ^a   Lubinski, M A ^a   O'Donnell, M ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC MICROSCOPES; CALCULATIONS; CORRELATION METHODS; ELASTIC MODULI; ELASTICITY; IMAGING SYSTEMS; MEDICAL IMAGING; SCANNING; SPECKLE; STRAIN; TISSUE; ULTRASONIC TRANSDUCERS;

B SCAN IMAGE; DISPLACEMENT; ELASTICITY MICROSCOPE; PHASE SENSITIVE COMPLEX CORRELATION; STRAIN IMAGING;

ULTRASONIC IMAGING;

EID: 0030374632     PISSN: 10510117     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)