Piezoelectric characterization of Pb(Zr, Ti)O3 thin films by interferometric technique

IEEE International Symposium on Applications of Ferroelectrics

Volumn 1, Issue , 1996, Pages 351-354

  Kholkin, A L ^a   Tagantsev, A K ^a   Brooks, K G ^a   Taylor, D V ^a   Setter, N ^a  

^a EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

FERROELECTRIC MATERIALS; INTERFEROMETERS; LEAD; PIEZOELECTRICITY; TITANIUM OXIDES; ZIRCONIUM;

DOUBLE BEAM LASER INTERFEROMETERS;

THIN FILMS;

EID: 0030374425     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)