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Volumn 1, Issue , 1996, Pages 6-10

Design and performance of beam test electronics for the PHENIX multiplicity vertex detector

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; CMOS INTEGRATED CIRCUITS; COLLIDING BEAM ACCELERATORS; DISCRIMINATORS; INTEGRATED CIRCUITS; MULTICHIP MODULES;

EID: 0030374320     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (2)

References (13)
  • Reference 정보가 존재하지 않습니다.

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.