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Volumn 1, Issue , 1996, Pages 6-10
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Design and performance of beam test electronics for the PHENIX multiplicity vertex detector
a a a a a a a a a a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ANALOG TO DIGITAL CONVERSION;
CMOS INTEGRATED CIRCUITS;
COLLIDING BEAM ACCELERATORS;
DISCRIMINATORS;
INTEGRATED CIRCUITS;
MULTICHIP MODULES;
BEAM TEST SYSTEM;
MULTIPLICITY VERTEX DETECTOR (MVD);
POST MEMORY ANALOG CORRELATORS;
PREAMPLIFIERS;
RELATIVISTIC HEAVY ION COLLIDER (RHIC);
RADIATION DETECTORS;
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EID: 0030374320
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (2)
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References (13)
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