Prediction of breakdown in SF6 under impulse conditions

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 3, Issue 6, 1996, Pages 836-842

  Xu, X ^a   Jayaram, S ^a   Boggs, S A ^b  

^a UNIVERSITY OF WATERLOO   (Canada)

^b UNIVERSITY OF CONNECTICUT   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD EFFECTS; ELECTRIC INSULATION COORDINATION; ELECTRONS; MATHEMATICAL MODELS; PROBABILITY; SULFUR COMPOUNDS;

BREAKDOWN PROBABILITY; ELECTRON DETACHMENT; IMPULSE BREAKDOWN; INITIAL ELECTRON PRODUCTION; QUASI UNIFORM FIELDS; STREAMER FORMATION LENGTH;

ELECTRIC BREAKDOWN;

EID: 0030373299     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/94.556569     Document Type: Article

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