Applicability of rotationally sheering interferometers to the testing of the optical systems without rotational symmetry

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2817, Issue , 1996, Pages 187-197

  Scholl, Marija S ^a  

^a Cent de Investigaciones en Optica

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; CHARACTERIZATION; OPTICAL SYSTEMS; REMOTE SENSING; SPACE APPLICATIONS; TESTING;

ROTATIONALLY SHEARING INTERFEROMETERS; WAVEFRONT ASYMMETRY;

INTERFEROMETERS;

EID: 0030373091     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (3)