Defect detection in apples by means of x-ray imaging

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2907, Issue , 1996, Pages 176-185

  Schatzki, Thomas F ^a   Haff, Ron P ^a   Young, Richard ^a   Can, Ilkay ^a   Le, Lan Chau ^a   Toyofuku, Natsuko ^a  

^a AGRICULTURAL RESEARCH SERVICE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT DETECTION; LINE SCANNING; MACHIE RECOGNITION; X RAY IMAGING; X RAY RADIOGRAPHIC IMAGING;

AGRICULTURAL PRODUCTS; COMPUTER VISION; DEFECTS; DETECTORS; X RAY RADIOGRAPHY;

IMAGING TECHNIQUES;

EID: 0030372251     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (18)