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Volumn , Issue , 1996, Pages 341-344
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Investigation of the role of Ni in forming ultra-low resistance Ni-Ge-Au ohmic contacts to n + GaAs
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Author keywords
[No Author keywords available]
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Indexed keywords
DOPANT DISTRIBUTION;
COMPOSITION EFFECTS;
ELECTRIC RESISTANCE;
ELECTRON BEAMS;
METALLOGRAPHIC MICROSTRUCTURE;
NICKEL ALLOYS;
OPTIMIZATION;
SEMICONDUCTING GALLIUM ARSENIDE;
OHMIC CONTACTS;
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EID: 0030371557
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (2)
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References (3)
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