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Volumn 185, Issue 1-4, 1996, Pages 313-316
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Thickness dependence of dielectric losses in TGSe
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTALS;
DIELECTRIC PROPERTIES;
FREQUENCIES;
PHASE TRANSITIONS;
POLARIZATION;
THERMAL EFFECTS;
DIELECTRIC LOSSES;
DOMAIN WALL RELAXATION FREQUENCIES;
THICKNESS DEPENDENCE;
DIELECTRIC MATERIALS;
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EID: 0030368252
PISSN: 00150193
EISSN: None
Source Type: Journal
DOI: 10.1080/00150199608210541 Document Type: Article |
Times cited : (2)
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References (11)
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