Simulation of charge cloud evolution in silicon drift detectors

IEEE Nuclear Science Symposium & Medical Imaging Conference

Volumn 1, Issue , 1996, Pages 558-562

  Segal, J ^a   Plummer, J ^a   Kenney, C ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; MONTE CARLO METHODS; SILICON SENSORS;

CHARGE CLOUD EVOLUTION; COULOMB REPULSION; DOPANT CONCENTRATION; SILICON DRIFT DETECTORS;

PARTICLE DETECTORS;

EID: 0030368041     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)