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Volumn 355, Issue 5-6, 1996, Pages 657-664

Surface characterization of fluorinated polymers (PTFE, PVDF, PFA) for use in ultratrace analysis

Author keywords

[No Author keywords available]

Indexed keywords

TRACE ANALYSIS;

EID: 0030366997     PISSN: 09370633     EISSN: None     Source Type: Journal    
DOI: 10.1007/s0021663550657     Document Type: Article
Times cited : (19)

References (12)
  • 3
    • 25644441462 scopus 로고
    • Vit-Lab, company brochure
    • Gesamtkatalog (1994/95) Vit-Lab, company brochure
    • (1994) Gesamtkatalog
  • 12
    • 0003552056 scopus 로고
    • Brochure of the Semiconductor Industry Association, San Jose, CA, USA
    • The National Technology Roadmap for Semiconductors (1994) Brochure of the Semiconductor Industry Association, San Jose, CA, USA
    • (1994) The National Technology Roadmap for Semiconductors


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.