SCOPUS 정보 검색 플랫폼

Fresenius' Journal of Analytical Chemistry

Volumn 355, Issue 5-6, 1996, Pages 601-605

Comparison of various calibration techniques for the direct spectroscopical analysis of SiC powders

(3) Florian K a Hassler, J b Schron W c

a TECHNICAL UNIVERSITY OF KO ICE (Slovakia)

b ESK Ceramics GmbH & Co KG (Germany)

c FRIEDRICH SCHILLER UNIVERSITY JENA (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; POWDERS; SILICON CARBIDE;

ATOMIC ABSORPTION SPECTROMETRY; ELECTROTHERMAL VAPORIZATION; INDUCTIVE COUPLING PLASMA SPECTROMETRY; MULTICOMPONENT ANALYSIS; STANDARD CURVE; STANDARD DEVIATION; UNCERTAINTY;

CHEMICAL ANALYSIS;

EID: 0030365823 PISSN: 09370633 EISSN: None Source Type: Journal
DOI: None Document Type: Review

Times cited : (8)

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