High-voltage stability coatings in the Zeus panel

Philips Journal of Research

Volumn 50, Issue 3-4, 1996, Pages 407-419

  Balkenende, A R ^a   Jaarsma, G T ^a   Hoogsteen, W ^a   Lobl H P ^b   Scholten, M ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

^b PHILIPS RESEARCH LABORATORIES   (Germany)

Author keywords

Chromium oxide; Cr2O3; Display; Field emission; High voltage stability; Screen spacer; Si3N4; Silicon nitride; Spraying; Sputtering; Zeus panel

Indexed keywords

COMPOSITION EFFECTS; DISPLAY DEVICES; OXIDES; PHOSPHORS; SILICON NITRIDE; SPRAYED COATINGS; SPUTTERING; STOICHIOMETRY;

PHOSPHOR LIFETIME; SECONDARY ELECTRON EMISSION LAYER; ZEUS PANEL;

ELECTRIC INSULATING COATINGS;

EID: 0030365394     PISSN: 01655817     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0165-5817(97)84683-9     Document Type: Article

References (6)

1. G.G.P. van Gorkom, Appl. Surface Sci., to be published.
2. S.T. de Zwart, G.G.P. van Gorkom, B.H.W. Hendriks, N. Lambert and P.H.F. Trompenaars, Basics of electron transport over insulators, Philips J. Res., this issue (1996).
3. B.H.W. Hendriks, G.G.P. van Gorkom, A.T.M.H. van Keersop, N. Lambert, P.H.F. Trompenaars and S.T. de Zwart, Monte Carlo calculations of the electron hop transport in various parts of a Zeus display, Philips J. Res., this issue (1996).
4. J.J. Scholtz, D. Dijkkamp and R.W.A. Schmitz, Secondary electron emission properties, Philips J. Res., this issue (1996).
5. H.P. Löbl and M. Huppertz, 10th Int. Conf. on Thin Films, Salamanca, 1996, to be published in Thin Solid Films.
6. H. J. Ligthart, P. J. Slikkerveer, F.H. in't Veld, P.H.W. Swinkels and M. H. Zonneveld, Glass and glass machining in Zeus panels, Philips J. Res., this issue (1996).