Environmental Effect on Coulomb Blockade in Ultrasmall Single Tunnel Junctions

Journal of the Physical Society of Japan

Volumn 65, Issue 10, 1996, Pages 3123-3126

  Shimazu, Yoshihiro ^a   Yamagata, Tomohiro ^a   Ikehata, Seiichiro ^b   Kobayashi, Shun Ichi ^a  

^a UNIVERSITY OF TOKYO   (Japan)

^b TOKYO UNIVERSITY OF SCIENCE   (Japan)

Author keywords

Charging effect; Coulomb blockade; Environmental effect; Lead resistance; Resistance quantum; Ultrasmall tunnel junction

Indexed keywords

EID: 0030365282     PISSN: 00319015     EISSN: None     Source Type: Journal    
DOI: 10.1143/JPSJ.65.3123     Document Type: Article

References (10)

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