Nanomechanical investigations and modifications of thin films based on scanning force methods

Nanotechnology

Volumn 7, Issue 4, 1996, Pages 346-350

  Allers, W ^a   Hahn, C ^a   Lohndorf M ^a   Lukas, S ^a   Pan, S ^a   Schwarz, U D ^a   Wiesendanger, R ^a  

^a UNIVERSITY OF HAMBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EPITAXIAL GROWTH; FRICTION; FULLERENES; HIGH TEMPERATURE SUPERCONDUCTORS; MECHANICAL PROPERTIES; MICROSCOPES; MODIFICATION; NANOTECHNOLOGY; PHOTOLITHOGRAPHY; SUBSTRATES; TRANSPORT PROPERTIES;

NANOMECHANICAL PROPERTIES; SCANNING FORCE MICROSCOPY;

THIN FILMS;

EID: 0030365134     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/7/4/007     Document Type: Article

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