Scanning work function microscopy

Fresenius' Journal of Analytical Chemistry

Volumn 355, Issue 5-6, 1996, Pages 419-424

  Oechsner, Hans ^a  

^a Rheinland Pfälzische Technische Universität Kaiserslautern Landau   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

MICROANALYSIS; POLYCRYSTALS;

AUGER EFFECT; MULTILAYER; SECONDARY ELECTRON EMISSION; SURFACE ANALYSIS; SURFACE REACTIONS; WORK FUNCTIONS;

SCANNING ELECTRON MICROSCOPY;

EID: 0030364890     PISSN: 09370633     EISSN: None     Source Type: Journal    
DOI: 10.1007/s0021663550419     Document Type: Article

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