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Volumn 13, Issue 10, 1996, Pages 772-774
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Structural and critical behaviors of Ag rough films deposited on liquid substrates
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Author keywords
[No Author keywords available]
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Indexed keywords
MAGNETRON SPUTTERING;
SILICONES;
AG ATOMS;
ATOM CLUSTERS;
CRITICAL BEHAVIOUR;
DEPOSITION MECHANISM;
LENGTH SCALE;
LIQUID SUBSTRATE;
RELATIVE SHIFT;
RF MAGNETRON SPUTTERING METHOD;
SILICONE OIL;
STRUCTURAL BEHAVIORS;
SUBSTRATES;
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EID: 0030364631
PISSN: 0256307X
EISSN: None
Source Type: Journal
DOI: 10.1088/0256-307X/13/10/016 Document Type: Article |
Times cited : (14)
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References (6)
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