Accelerated life-time testing and resistance degradation of thin-film decoupling capacitors

IEEE International Symposium on Applications of Ferroelectrics

Volumn 1, Issue , 1996, Pages 421-425

  Al Shareef, Husam ^a   Dimos, Duane ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC RESISTANCE; LEAD COMPOUNDS; LEAKAGE CURRENTS; POINT DEFECTS; THIN FILM DEVICES; TITANIUM COMPOUNDS; ZIRCONIUM COMPOUNDS;

FRENKEL-POOLE PROCESS; MEAN TIME TO FAILURE; THIN FILM DECOUPLING CAPACITORS;

CERAMIC CAPACITORS;

EID: 0030363804     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)