Does building-in reliability imply more or less wafer-level reliability testing?

International Integrated Reliability Workshop Final Report

Volumn , Issue , 1996, Pages 1-15

  McPherson, J W ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INFORMATION USE; INTEGRATED CIRCUIT MANUFACTURE; RELIABILITY; ULSI CIRCUITS;

BUILDING IN RELIABILITY (BIR) STRATEGY; WAFER LEVEL RELIABILITY (WLR);

INTEGRATED CIRCUIT TESTING;

EID: 0030362397     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)