Methods of measuring the electric-field-dependent absorption coefficient in quantum confined structures

Conference on Optoelectronic & Microelectronic Materials and Devices, Proceedings, COMMAD

Volumn , Issue , 1996, Pages 293-296

  Siliquini, J F ^a   Xu, M G ^a   Membreno, Umana ^a   Clark, A ^a   Dell, J M ^a  

^a UNIVERSITY OF WESTERN AUSTRALIA   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION COEFFICIENT; AIR SEMICONDUCTOR INTERFACES;

APPROXIMATION THEORY; ELECTRIC CURRENT MEASUREMENT; ELECTRIC FIELD EFFECTS; ELECTRON ABSORPTION; ELECTRON REFLECTION; MEASUREMENT ERRORS; SEMICONDUCTING FILMS; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICE STRUCTURES; THIN FILMS;

SEMICONDUCTOR QUANTUM WELLS;

EID: 0030361656     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)