Development of an acoustic technique for assessing structure-property characteristics of polymeric thin films using high pressure

Proceedings of the IEEE Ultrasonics Symposium

Volumn 1, Issue , 1996, Pages 413-417

  Konagurthu, S ^a   Peterson, R ^a   Bond, L J ^a   Greenberg, A R ^a   Krantz, W B ^a   Kishoni, D ^a   Kuhns, D ^a   Burgess, L ^a   Brodsky, A M ^a  

^a UNIVERSITY OF COLORADO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH PRESSURE EFFECTS; MICROSTRUCTURE; REFLECTOMETERS; SEPARATION; THICKNESS MEASUREMENT; THIN FILMS; TIME DOMAIN ANALYSIS;

ACOUSTIC TIME DOMAIN REFLECTOMETRY (ATDR); MACROVOIDS;

POLYMERIC MEMBRANES;

EID: 0030360992     PISSN: 10510117     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)