Z-scan measurements on substituted thiophene oligomers

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2853, Issue , 1996, Pages 28-36

  Fleitz, Paul A ^a   Sutherland, Richard L ^a   Tang, Nansheng ^a   Li, W ^a   Yu, Luping ^a  

^a SCIENCE APPLICATIONS INTERNATIONAL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NONLINEAR ABSORPTION; NONLINEAR REFRACTION; THIOPHENE; TWO PHOTON ABSORPTION; Z SCAN TECHNIQUE;

ABSORPTION SPECTROSCOPY; LASER BEAMS; LIGHT REFRACTION; NONLINEAR OPTICS; OLIGOMERS; OPTICAL PROPERTIES; ORGANIC COMPOUNDS; SOLVENTS;

OPTICAL MATERIALS;

EID: 0030360869     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (26)