Mixed-signal circuit testing - a review

Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems

Volumn 2, Issue , 1996, Pages 1064-1067

  Wey, Chin Long ^a  

^a MICHIGAN STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; ELECTRIC NETWORK ANALYSIS; ELECTRONICS PACKAGING; MAINTAINABILITY;

BUILT IN SELF TEST (BIST) TECHNIQUE; DESIGN FOR TESTABILITY (DFT) TECHNIQUE; FAULT DIAGNOSIS; MIXED SIGNAL CIRCUITS;

INTEGRATED CIRCUIT TESTING;

EID: 0030360493     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (33)