Thickness dependent ultraviolet photoemission spectroscopy and scanning tunneling microscopy study of BTA molecular layers on Cu(110)

Journal of the Korean Physical Society

Volumn 29, Issue 6, 1996, Pages 745-749

  Park, Yeonjoon ^a   Noh, Hyunpil ^a   Kuk, Young ^a   Cho, Kehyun ^b   Sakurai, T ^c  

^a Seoul National University   (South Korea)

^b Yeungnam University   (South Korea)

^c TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0030359793     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (5)

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2. R. F. Roberts, J. Electron Spectrosc. Related Phenomena 4, 273 (1974).
3. B. Fang, C. G. Olson and D. W. Lynch, Surf. Sci. 176, 476 (1986).
4. Z. Xu, S. Lau and P. W. Bohn, Surf. Sci. 296, 57 (1993).
5. K. Cho, J. Kishimoto, T. Hashizume and T. Sakurai, Jpn. J. Appl. Phys. 33, 125 (1994).