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Volumn 57, Issue 4, 1996, Pages 199-223

Evolution of diffuse scattering during 2H to 6H 'direct' transformation in SiC

Author keywords

Diffuse scattering; Monte Carlo technique; SiC; Stacking faults

Indexed keywords

COMPUTER SIMULATION; CORRELATION METHODS; DIFFUSION; MATHEMATICAL MODELS; MONTE CARLO METHODS; SCATTERING; SILICON CARBIDE; SINGLE CRYSTALS; STACKING FAULTS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EID: 0030358137     PISSN: 01411594     EISSN: None     Source Type: Journal    
DOI: 10.1080/01411599608208746     Document Type: Article
Times cited : (3)

References (20)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.